Model: JXA-8230
Manufacturer: JEOL
Attachment: Spectrometer (* 3), Energy Spectrometer (* 1)
Analysis element: B-U
Resolution: 3nm

Electron probe is an instrument that uses characteristic X-rays generated by the action of an electron beam on a sample for micro area composition analysis. It can be used to analyze the chemical composition of mineral micro areas in thin sections. In addition to a few lighter elements such as H, He, Li, Be, as well as elements after U, qualitative and quantitative analysis can be carried out. Can perform point, line scanning, and surface scanning analysis.

Example: Measurement results of EPMA surface distribution of battery powder