ZeissEmbark on a revolutionary era of electron microscope speed

With the help of MultiSEM microscope, you can fully utilize the collection speed of 91 parallel electron beams. Nowadays, you can image centimeter level samples with nanometer resolution. This excellent scanning electron microscope (SEM) is designed for continuous and reliable operation for 7 x 24 hours. By simply setting up a high-performance data acquisition process, MultiSEM can independently and automatically complete high contrast image acquisition.

Control MultiSEM with mature ZEN imaging software: You can intuitively and flexibly manage all functional options of this high-performance scanning electron microscope.

　　Capture images at extremely high speed and nanometer resolution

91 electron beams work simultaneously, with excellent imaging speed.

Imaging an area of 1 mm2 within a few minutes with a resolution of up to 4 nm.

By utilizing optimized secondary electron detectors, high contrast images can be captured with low signal-to-noise ratio.

　　Collection and imaging of large samples

MultiSEM is equipped with a sample holder that can hold samples of size 10 cm x 10 cm.

Imaging the entire sample and discovering all details helps with scientific research.

The automatic acquisition scheme can achieve large-area imaging - you will obtain fine nano images without losing visible information.

　　ZEN imaging software

Easily and intuitively operate MultiSEM using mature ZEN software, which is applied to all Zeiss imaging systems

Intelligent automatic adjustment program can help you capture images with high resolution and high contrast

Quickly and easily create complex automatic collection processes based on the actual situation of the sample

MultiSEM's ZEN software enables high-speed continuous parallel imaging

Open API software interfaces can provide flexible and fast application development

Data acquisition of continuous slice tomography for large volume samples

Use ATUMtome to automatically cut resin embedded biological tissue. Collect up to 1000 consecutive slices within a day.

Fix the slice onto the silicon chip with tape and image it using a Zeiss optical microscope. Use Zeiss' ZEN imaging software and Shuttle&Find functional components for overall imaging. Then move the silicon chip under the MultiSEM electron microscope, preview the sample as a whole, and plan the entire experiment using the ZEN software user interface.

Set up the entire experiment using a graphical control center. Efficient automatic slice detection can identify and label regions of interest, saving a lot of time.