Name: ZEISS Xradia 510 Versa
Brand: Zhejiang Langtong Precision Instrument Co., Ltd
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33 Xinwen Road, Gongshu District, Hangzhou, Zhejiang

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ZEISS Xradia 510 Versa

Even at larger working distances, multifunctionality can be achieved - millimeters to inches away from the light source, using the ZEISSXradia510Versa

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Multi functionality can be achieved even at larger working distances - ranging from millimeters to inches from the light source

Utilizing the ZEISSXradia510Versa3D X-ray microscope (XRM) to achieve new levels of discovery, XRM is the industry's leading in-situ/4D solution. Our unique RaaD (Long Range Resolution) feature breaks the one micron resolution barrier of millimeter to centimeter samples.

This instrument perfectly combines world leading resolution and contrast with flexible working distance to expand non-destructive imaging capabilities in the laboratory.

Advantages:

The XradiaVersa architecture adopts two-stage amplification technology, allowing you to achieve unique resolution at a distance (RaaD). In the first stage, the sample image is magnified by geometric magnification, similar to traditional micro CT. In the second stage, the scintillator converts X-rays into visible light and then optically amplifies them. Reducing reliance on geometric magnification enables the XradiaVisa instrument to maintain sub micron resolution over larger working distances. This enables you to effectively study the widest sample size, including in situ chambers. In addition, various optional features extend the benefits brought by the core architecture of the system.

Use non-destructive 3D imaging to preserve and expand the use of valuable samples

Using a unique Versa microscope design, the highest resolution can be achieved at the maximum working distance from the light source, which is a prerequisite for in situ and large sample imaging

Under a wide range of magnification, the same sample can be imaged at long scales, with a true spatial resolution of<0.7 μ m and voxel sizes below 70 nm.

Industry leading 4D and on-site capabilities, supporting various on-site drilling rigs for sub micron imaging of actual size samples (mm to inches), weighing up to 25kg and sample sizes up to 300mm

Unique dual stage amplification architecture, easy navigation through multiple amplification detection systems, continuous operation through automatic multi-point tomography and repeated scanning, and high-speed reconstruction

Advanced absorption and phase contrast of low-Z materials and soft tissues

Scout-and-Scan ™ Control system, easy-to-use workflow settings, ideal for multi-user environments

True sub micron spatial resolution from source to millimeter to inch:

The Xradia510Versa maximizes the effectiveness of X-ray microscopy (XRM) and enables flexible 3D imaging in various research environments. The real spatial resolution of Xradia510Versa is better than 0.7 μ m, and the achievable voxel size is less than 70nm. Through advanced absorption contrast and innovative phase contrast, the multifunctionality of soft or low-Z materials is experienced, overcoming the limitations of traditional computed tomography.

Achieve performance beyond micro CT and extend scientific research beyond the limits of tablet systems. Traditional tomography relies on single-stage magnification, while the XradiaVisa instrument adopts a unique two-stage process based on a synchrotron aperture optical system. Its detection system is optimized for resolution, contrast, and high resolution at large working distances. With the long-range ZEISS resolution (RaaD), you can achieve unprecedented laboratory based exploration for various applications and sample types.

Non destructive X-rays and flexible zoom capabilities enable you to image the same sample at various magnifications. As the industry's leading 4D/in-situ solution, with XradiaVersa, you can uniquely characterize the microstructure of materials in their native environment and study the evolution of performance over time. The optional Versa in-situ kit allows you to optimize settings, simplify operations, and provide faster result times, organizing facilities that support on-site drilling rigs (such as wiring and pipelines) for maximum imaging performance and ease of use.

In addition, the Scout and Scan control system achieves an efficient workflow environment through recipe based settings, making the Xradia510Versa easy to provide convenience for users with various levels of experience.

Minimum sample preparation required

The optional VersaInSituKit can organize facilities that support environmental chambers such as wiring and piping to achieve optimal imaging performance and simplify setup

The Autoloader option allows you to program and run up to 14 samples at once, maximizing production efficiency and achieving automated workflows for high-capacity scanning.

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