Product features:

• Continuous variable incident angle of 30 ° to 80 °

• 0.4-46 microns incident depth, suitable for depth analysis, such as multi-layer film and coating analysis

• A 20mm large-sized crystal is very suitable for analyzing single-layer and ultra-thin films on silicon wafers or metal substrates. Compared to mirror reflection, the sensitivity can be increased by 1-2 orders of magnitude

• Combining electrochemical cell for infrared spectroscopy electrochemical research

• Extremely high luminous flux, providing the highest spectral quality in the shortest scanning time and improving detection limits
• Optional ZnSe \ \ Ge \ \ Si \ \ ZnS crystals
• Can be used as a variable angle mirror reflection accessory
• Reserved polarizer position, optional manual or automatic polarizer
• Optional automatic version, software adjustable incident angle

• Heated crystal disk, maximum temperature up to 130 ℃