Shanghai Nateng Instrument Co., Ltd
Home>Products>TS2500-RF Fully Automatic RF Probe Station
Product Groups
Firm Information
  • Transaction Level
    VIP member
  • Contact
  • Phone
  • Address
    Room 707, Aiqian Building, 599 Lingling Road, Xuhui District, Shanghai, China
Contact Now
TS2500-RF Fully Automatic RF Probe Station
TS2500-RF Fully Automatic RF Probe Station
Product details

TS2500-RF - the first fully automated probe system specifically designed for RF production testing. MPI quickly became an innovative leader in our service market by launching over a dozen new products in less than two years. The latest product innovation of MPI is a fully automated probe system specifically designed for radio frequency (RF) production testing. This system is compatible with all MPI system accessories and is designed specifically to meet the testing needs of production grade advanced RF equipment.


product description

1. Suitable for various mass-produced wafer measurement applications

Can perform DC-IV/DC-CV/Pulsed-IV measurements simultaneously

RF measurement - up to 67 GHz

2. Mass production reliability

Specially designed for 24/7 stable and reliable mass production testing

3. Ergonomic design and flexible selection

Simple and convenient design of single crystal circular upper plate for front door

Large area workbench design, capable of carrying up to 12x DC or 4x DC+4x RF micro locators, or 4.5 "standard probe card fixtures

Double crystal circle picker and built-in pre alignment function effectively improve output

There are also various wafer stages and accessories to choose from

Standard equipped with eccentric axis wafer alignment lens

There is also an optional upward imaging lens to assist in aligning the probe with the test object

Optional thin wafer processing options

Characteristics and advantages

1. Thin wafer handling

The unique design of the S2500-RF chuck and wafer lift pin enables safe processing of wafers as thin as 50 microns, making it possible to test challenging thin III-Vs compound wafers

The RF chuck consists of two auxiliary chucks made entirely of special ceramic materials, used for precise RF calibration. The auxiliary chuck and hot chuck can also be used to maintain the cleanliness of the probe



2. High throughput

Automation includes dual end actuators and twin wafer cassette holders, suitable for 150mm or 200mm wafers, providing efficient wafer swapping and higher testing speeds. The maximum speed of TS2500-RF can reach 10 chips per second (depending on the final system configuration), making it an ideal choice for electrical testing in the production of discrete RF devices and integrated circuits (ICs)



3. Advanced alignment system

Advanced calibration features, such as off-axis and chuck mounted upper cameras, make the TS2500-RF an ideal platform for testing in complex RF measurement configurations. Decades of experience in MPI Photonics' automation department make these features more reliable



4. Complete Test Solution

TS2500-RF can be equipped with advanced RF accessories such as RF MicroPositioners, RF cables, calibration substrates, and TITANRF probes to ensure more accurate RF measurements

With the integration of VNA and DUT, the collaboration between MPI and Rohde&Schwarz, and new advanced calibration technologies, TS2500-RF has become a comprehensive measurement solution capable of handling the complexity of RE production testing




Online inquiry
  • Contacts
  • Company
  • Telephone
  • Email
  • WeChat
  • Verification Code
  • Message Content

Successful operation!

Successful operation!

Successful operation!