Second hand Oxford thickness gauge

Instrument Introduction:

The CMI900 fluorescent X-ray coating thickness gauge has the advantages of non-destructive, non-contact, rapid non-destructive measurement, multi-layer alloy measurement, high productivity, and high reproducibility for measuring surface coating thickness. It has a wide range of applications from quality management to cost savings.

Scope of application:

Used for measuring the thickness of surface coatings in various industries such as electronic components, semiconductors, PCBs, FPCs, LED brackets, automotive parts, functional electroplating, decorative parts, connectors, terminals, sanitary ware, jewelry, etc;

Measure the thickness of coatings, metal coatings, thin films, or the composition of liquids (composition analysis of plating solutions).

Main features:

Wide measurement range, detectable element range: Ti22-U92;

Can simultaneously measure 5 layers/15 elements/coexisting elements with positive values;

High precision and good stability;

Powerful data statistics and processing capabilities;

NIST certified standard sheet;

Global service and support.

Parameter introduction:

1. X-ray excitation system

Vertical downward X-ray optical system

Air cooled micro focusing X-ray tube, Be window

Standard target material: Rh target; Optional target materials: W, Mo, Ag, etc

Power: 50W (4-50kV, 0-1.0mA)

Equipped with a safety anti radiation shutter

Secondary X-ray filter: 3 positions programmable exchange, multiple materials and thicknesses of secondary filters to choose from

2. Collimator system

Single collimator component, automatic control of multiple collimators

Component: Up to 6 specifications of collimators can be assembled simultaneously

Multiple specifications and sizes of collimators to choose from:

- Circular, such as 4, 6, 8, 12, 13, 20 mil, etc

Namely 0.102, 0.152, 0.203, 0.305, 0.330, 0.508mm

- Rectangle, such as 1x2, 2x2, 0.5x10, 1x10, 2x10, 4x16mil, etc

Namely 0.025 * 0.05, 0.05 * 0.05, 0.013 * 0.254, 0.025 * 0.254, 0.051 * 0.254, 0.102 * 0.406mm

When measuring spot size at a focal distance of 12.7mm, the minimum measured spot size is 0.078 x 0.055mm (using a 0.025 x 0.05mm<i.e. 1x2mil>collimator). At a focal distance of 12.7mm, the larger measured spot size is 0.38 x 0.42mm (using a 0.3mm<i.e. circular 12mil>collimator)

3. Sample Room

Slotted sample chamber sample table size larger 610mm x 610mm XY axis movement range standard: 152.4 x 177.8mm<Programmable>Z-axis programmable movement height 43.18mm XYZ axis control mode multiple control modes optional: XYZ three-axis program control; XY axis manual control and Z-axis program control; XYZ three-axis manual control

4. Sample observation system

High resolution color CCD observation system with a standard magnification of 30x. Choose between 50 fold and 100 fold observation systems. Laser autofocus function, variable focal length control function and fixed focal length control function, computer system configuration, IBM computer

HP or Epson color inkjet printer analysis application software operating system: Windows XP Chinese platform analysis software package: SmartLink FP software package

5. Thickness measurement range

Measurable thickness range: depends on your specific application.

The basic analysis function is calibrated using the basic parameter method. Oxford Instruments will provide necessary calibration standard samples based on your application;

Sample type: Coating; Detectable element range: Ti22-U92; Can simultaneously measure 5 layers/15 elements/coexisting element corrections; Precious metal detection, such as Au karat evaluation; Material and alloy element analysis; Material identification and classification testing;

Simultaneously display and compare spectra of up to 4 samples; Qualitative analysis of elemental spectra. Adjustment and correction functions

System automatic adjustment and calibration function, automatic elimination of system drift measurement automation function, mouse activation measurement mode: "Point and Shot" Multi point automatic measurement mode: random mode, linear mode, gradient mode, scanning mode, repeated measurement mode

Measurement position preview function, laser focusing and autofocus function, sample stage programmable function, setting measurement points, continuous multi-point measurement

Measurement position preview (chart display), statistical calculation function, average value, standard deviation, relative standard deviation, larger value, minimum value, data variation range, data number CP、CPK、 Control upper limit chart and control lower limit chart optional software: The statistical report editor allows users to customize multimedia reports, data grouping, X-bar/R charts, histogram database storage functions,

System safety monitoring function, Z-axis protection sensor, sample chamber door opening and closing sensor