The combination of scanning electron microscopy and Raman spectroscopy can perform in situ micro analysis of samples, achieving systematic analysis and testing of samples. Given that scanning electron microscopy data and Raman spectroscopy data can be collected from the same point, it is possible to quickly and intuitively characterize the relationship between sample surface morphology and material molecular structure. Based on SEM images, rapid and non-destructive material composition analysis can be performed on the selected testing area of the sample more accurately, obtaining accurate sample composition data.

Example 1: Characterization of the PO4/SO4 ratio in micron sized aluminum phosphate minerals and identification of complex compound components such as alunite and pyrophosphate calcium aluminate

Example 2: Raman spectroscopy analysis of uranyl minerals at the particle level

Example 3: Distinguish between single-layer and multi-layer regions in the prepared graphene sample