Connect adjacent surfaces to measure angles greater than 90 °

Measuring complex surfaces with steep angles is very difficult because shadow effects can prevent you from obtaining complete measurement results in a single acquisition. It is necessary to tilt the sample in order to measure the sample from two different positions and combine the two morphology results to obtain a complete measurement result.

Degree of freedom, unlimited measurement

Through automated programs, different parts of the sample can be measured with just one click. The user-friendly interface allows you to find the measurement location without any constraints. Then focus on the key parts of the sample and add them to the automation routine. Finally, click "Get" to obtain all measuring components with just one click. This is a fast and convenient method for automated measurement programs.

Accurate and reliable measurement of surface smoothness

Our confocal and interferometric measurement techniques allow you to measure rough surfaces of any level, from extremely rough (diamond or mirror). According to NPL, NIST, and PTB, we converted our system into a repetitive and traceable system using confocal technology and high numerical roughness standards. Ai multifocal overlay technology enables the cutting edge radius of the system.
Provides a fast and easy response for measuring large slopes.

Non contact assessment
S Neox has adhered to its initial design goals as a high-performance 3D optical profilometer, surpassing all existing optical profilometers. S Neox combines three major technologies - confocal (most suitable for high slope surfaces), interferometric (providing the highest vertical resolution), and Ai multifocal overlay (measuring morphological features in just a few seconds), integrating the three technologies into the same sensor head without using any moving parts.

System specifications

Measurement principle: Confocal, PSI, ePS, CS, AI multifocal overlay and film thickness

Observation modes: bright field, DIC color, confocal, interferometric phase contrast

Camera: 5Mpx: 2448x2048 pixels (up to 180fps)

Total magnification: 60X-21600X (27 inch monitor)

Display resolution: 0.001nm

Field of view: 0.113 to 16.8mm (single field of view)

Step repeatability: 60.1%

Step accuracy: 60.5%

General vertical scanning range: Linear platform: 40mm; 5nm resolution

Fine vertical scanning range: PZT:200pm; 0.5nm resolution

Maximum Z measurement range: PSI20pm; CS110mm; Confocal&Ai multifocal overlay 34mm

XY platform range: manual: 40x40mm; Electric: 114x75mm, 154x154mm, 255x215mm, 302302mm

LED light source: red (630nm); Green (530nm); Blue (460nm) and white (575nm)

Maximum number of splices: 10x12 (high-resolution); 175x175(500 Mpx)

Objective lens turntable: 6-hole electric sample

Reflectivity: 0.05% to 100%

Sample weight: up to 25Kg

Sample height: 40mm (standard bracket); 150mm and 350mm (optional)

SENSOFAR is a cutting-edge technology enterprise that adheres to the highest quality standards in the field of morphology measurement
Sensofar Metrology provides high-precision optical profilometers based on confocal, multifocal overlay, and interferometry technologies, offering standard systems for research and quality testing laboratories to complete non-contact metrology solutions for online production processes. Sensofar Group is headquartered in Barcelona and is also a technology and innovation center in Europe. The group has representative offices in over 30 countries and offices in Asia, Germany, and the United States through a global network of strategically distributed partners.