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RoHS elemental analyzer
E8-SPR is a high-performance RoHS elemental analyzer specifically designed for RoHS halogen detection. Compared with ordinary EDXRF, it has high resol
Product details
Appearance features:
The instrument structure adopts ergonomic design, and the two sides of the instrument are designed according to the length of an adult's arm, making it easy to move and transport.
The top cover tilts at a 6-degree angle, symbolizing respect for the customer.
The surface adopts high-end car spray painting technology, using a combination of royal blue and elegant white. Blue represents technology, while white represents sanctity, symbolizing admiration for science.
Visual sample window.
Radiation protection:
The sample cover is embedded with a lead plate to shield against X-rays.
Radiation warning signs.
Maze like structure to prevent radiation leakage.
● Safety chain design; During the testing process, when the sample cover was accidentally opened, the circuit was quickly cut off in 0.1 μ S. After testing by an authoritative third-party, the X-ray dose rate fully complied with GB18871-2002 "Basic Standards for Ionizing Radiation Protection and Radiation Source Safety".
Hardware technology:
Ultra short optical path design: improves halogen-free detection resolution, enhances sample analysis efficiency, reduces light tube power, and extends instrument lifespan.
Modular collimator, equipped with collimators of different materials according to the analyzed elements, thereby reducing the impact of collimators on the analyzed elements and improving element resolution.
Aerodynamic design accelerates the cooling of the light tube, effectively reducing the internal temperature of the instrument; Silent design.
The circuit system complies with EMC and FCC testing standards.
Patent technology for quick disassembly of sample discs and replacement of thin films with software technology:
Analyze elements: elements between Na~U.
Analysis time: 60 seconds.
Configure RoHS detection and analysis model, halogen-free analysis software interface is simple, modular design, clear functions, easy to configure coating thickness measurement model, toy command and other models.
The HeLeeX ED Workstation V3.0 software has one click backup and one click restore functions to protect user data security.
HeLeeX ED Workstation V3.0 is equipped with three algorithms based on different substrate samples to increase sample testing accuracy.
HeLeeX ED Workstation V3.0 is equipped with open analytical modeling capabilities, allowing customers to establish their own working models.
detector
Type: X123 detector (using original imported high-performance electrically cooled semiconductor detector)
● Be window thickness: 1mil
● Crystal area: 25mm2
● Best resolution: 145eV
● Signal processing system DP5
X-ray tube
Voltage: 0~50kV
Maximum current: 2.0mA
Maximum power: 50W
Target material: Mo
● Be window thickness: 0.2mm
● Service life: greater than 20000 hours
high voltage power supply
Output voltage: 0~50kV
● Filament current: 0~2mA
Maximum power: 50W
Ripple factor: 0.1% (p-p stability for 8 hours: 0.05%)
camera
● Micro focal length
5 million pixels
Collimator, filter
Quick disassembly of collimator and filter system
● Multiple material collimators
● Spot size available in sizes of 0.3mm, 0.7mm, 1.2mm, 2.0mm, 5.0mm, and 7.0mm
Multiple combinations of filters and collimators, automatically switched by software
Other accessories
Imported high-performance switching power supply
Imported low-noise, high air volume fan
● Dimensions: 380 mm x 510 mm x 365 mm (length x width x height)
Sample compartment size: 360mm × 330mm × 50mm (length x width x height)
● Instrument weight: 33.5kg
Power supply: AC220V/50Hz
Maximum power: 330W
Working temperature: 15-30 ℃
Relative humidity: ≤ 85%, no condensation
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