The remote VNF-200 VCSEL near-field characteristic analyzer is designed specifically for analyzing the surface near-field characteristics of VCSEL, featuring fast measurement speed, high optical resolution, and high measurement accuracy. The instrument adopts a combination of microscopic optical system and imaging system, and optimizes the design based on the characteristics of VCSEL to achieve high magnification microscopic imaging radiation analysis of VCSEL. Obtain two-dimensional array layout, defect point detection, and radiance data of VCSEL surface through a single measurement, and obtain single point size. Equipped with specialized analysis software, it can output test reports that meet the standards. Suitable for rapid and accurate analysis of VCSEL surface characteristics in production lines and laboratories.