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Probe Scanning Atomic Force Microscope FM Nanoview LS-AFM
Probe Scanning Atomic Force Microscope FM Nanoview LS-AFM
Product details
◆A commercial atomic force microscope that allows the sample to remain stationary while the probe moves for scanning;
◆The sample size and weight are almost unlimited, making it particularly suitable for testing oversized samples;
The sample stage has strong expandability and is very convenient for multi instrument linkageImplement in-situ detection;
◆Electric control sample moving table and lifting table, programmable multi-point position for fast and automated detection;
◆Longmen style scanning head design, marble base, vacuum adsorption and magnetic adsorption stage;
◆Intelligent needle insertion method for automatic detection of pressurized ceramic by motor control, protecting probes and samples;
◆High magnification assisted optical microscopy positioning, real-time observation and positioning of probes and sample scanning areas;
◆Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%
technical parameter
| Working mode | Contact mode, tap mode | Z lifting platform | Stepper motor drive control, minimum step size 10nm |
| Optional mode | Friction/lateral force, amplitude/phase, magnetic/electrostatic force | Z lifting stroke | 15mm (optional 20mm, 25mm) |
| Force spectrum curve | F-Z force curve, RMS-Z curve | Optical positioning | 5X optical objective lens (optional 10X/20X objective lens) |
| XYZ scanning method | Probe driven scanning, piezoelectric ceramic tube scanner | camera | 5-megapixel digital CCD |
| XY scanning range | 70×70um | Scanning rate | 0.6Hz~30Hz |
| Z-scan range | 5um | Scanning angle | 0~360° |
| Scanning resolution | Horizontal 0.2nm, vertical 0.05nm | Operating environment | Windows XP/7/8/10 operating system |
| XY sample stage | Stepper motor drive control, with a movement accuracy of 1um | communication interface | USB2.0/3.0 |
| XY movement stroke | 100 × 100mm (optional 200 × 200mm, 300 × 300mm) | Instrument structure | Longmen style scanning head, marble base |
| Sample stage | Diameter 100mm (optional 200mm, 300mm) | Shock absorption method | Spring suspension type (optional active shock absorber platform) |
| Sample weight | ≤15Kg |
Application Cases
2D grating/Scanning range15µm×15µm
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