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Park XE7 Atomic Force Microscope
Among the same level products, Park XE7 can bring measurement effects with Z-high nanometer resolution. Thanks to the atomic force microscope architec
Product details
Origin category | Import |
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Technical Parameter
XY scanner:
- Closed loop control single module flexible XY scanner.
- Scanning range: 50 μ m × 50 μ m (optional 100 μ m × 100 μ m, 10 μ m × 10 μ m)
Z scanner:
- Flexible guided high-intensity scanner
- Scanning range: 12 μ m (optional 25 μ m)
Sample stand:
- XY table working range: 13 × 13 mm
- Z-platform work scope: 29.5 mm
- Scope of work for the focusing table: 70 mm
Optical system:
- Direct view coaxial optical system for observable samples and probes
- 10X objective lens (optional 20X)
- Field of view: 480 × 360 μm
- CCD: 1M pixels (pixel resolution: 0.4 μm)
Circuit system:
- High performance DSP: 600 MHz with 4800 MIPS
- Large image size: 4096 x 4096 pixels, 16 data images
- Signal input: 20 channels of 16 bit ADC during 500kHz sampling
- Signal output: 21 channels of 16 bit ADC during 500kHz sampling
- Synchronization signal: TTL signal for image end, line end, and pixel end
- Active Q control (optional)
- Elastic constant calibration of cantilever beam (optional)
- CE Compliant
- Power supply: 120 W
- Signal processing module (optional)
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