Shanghai Maomo Scientific Instrument Co., Ltd
Home>Products>Park XE7 Atomic Force Microscope
Park XE7 Atomic Force Microscope
Among the same level products, Park XE7 can bring measurement effects with Z-high nanometer resolution. Thanks to the atomic force microscope architec
Product details
Origin category Import

Technical Parameter

XY scanner:

  • Closed loop control single module flexible XY scanner.
  • Scanning range: 50 μ m × 50 μ m (optional 100 μ m × 100 μ m, 10 μ m × 10 μ m)

Z scanner:

  • Flexible guided high-intensity scanner
  • Scanning range: 12 μ m (optional 25 μ m)

Sample stand:

  • XY table working range: 13 × 13 mm
  • Z-platform work scope: 29.5 mm
  • Scope of work for the focusing table: 70 mm

Optical system:

  • Direct view coaxial optical system for observable samples and probes
  • 10X objective lens (optional 20X)
  • Field of view: 480 × 360 μm
  • CCD: 1M pixels (pixel resolution: 0.4 μm)

Circuit system:

  • High performance DSP: 600 MHz with 4800 MIPS
  • Large image size: 4096 x 4096 pixels, 16 data images
  • Signal input: 20 channels of 16 bit ADC during 500kHz sampling
  • Signal output: 21 channels of 16 bit ADC during 500kHz sampling
  • Synchronization signal: TTL signal for image end, line end, and pixel end
  • Active Q control (optional)
  • Elastic constant calibration of cantilever beam (optional)
  • CE Compliant
  • Power supply: 120 W
  • Signal processing module (optional)

atomic force microscope atomic force microscope

Online inquiry
  • Contacts
  • Company
  • Telephone
  • Email
  • WeChat
  • Verification Code
  • Message Content

Successful operation!

Successful operation!

Successful operation!