CSIIt is a French scientific equipment manufacturer with professional expertiseAFMDesign concepts, as well as for existing onesAFMProvide design options. The company was established by a team of experts who areAFMWork in the field exceeds20Year. As pioneers with a background in manufacturing history, we have created with the best experienceNano-ObserverWe have found the most perfect combination between analog and digital electronic devices and advanced components. A high-quality research-orientedAFMSimultaneously meet the requirements of both advanced users and beginners. It avoids the system of laser alignment that requires pre positioning of the needle tip/The top and side views of the sample, combined with a vertical motor control system, make it easier to approach in advance through an optical window andX-YThe combination of sample translation stage makes sample positioning simple, providing an affordable solution for any research laboratory or factory.

Basic technical characteristics

1) Controller specifications

XYScan range 100 μm（±10%），ZAxis scanning range9μm（±10%），XYDrive resolution24Bit control-0.06Åm

Data sampling points up to4096

2) Pre configured mode

All required measurements can be achieved without the need for additional modules, simply by selectingAFMThe mode, software driver, and connection to the corresponding electronic device will not generate

Error or damage. With a simple click, you can access all of themAFMSwitching between modes,

3) Electrical testing of flexible materialsResiScope

flexibilityResiScopeThe principle is based on intermittent contact, and the constant force of the friction gift box needle tip of the sample provides quantitative measurement without damaging the surface of the fine sample.

4) High definitionKFMmode

Besides the standard onesKFMpattern,Nano-ObserverIt can also provide a high-definition optionKFMThe mode greatly improves the resolution and enhances the sensitivity of surface potential measurement,

5）Nano-Observerenvironmental control

The design provides environmental control modules (gas, humidity, temperature) to improve electrical measurement performance or protect samples from oxidation

application

Ordinary sample/Surface morphology of biological samples

Multi module configuration measurement（PFM/KFM/EAFM/CAFMEtc.)

pass throughResiScope^TMMode scanning (current and resistance exceeding 10 orders of magnitude).