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MIJ-15LAI/K2 Fixed Leaf Area Index Meter
The MIJ-15LAI/K2 fixed leaf area index instrument is a fixed instrument produced by EMJ Corporation in Japan. The instrument is suitable for fixed-poi
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MIJ-15LAI/K2 Fixed Leaf Area Index Meter The MIJ-15LAI/K2 fixed leaf area index meter is a fixed instrument produced by EMJ Corporation in Japan. The instrument is suitable for fixed-point observation and uses spectral measurement methods (PAR (400-700 nm) and NIR (700-1000 nm)) to reflect and absorb only in the parts of the leaves that contain chlorophyll. The leaf area index is measured by the ratio of the spectral transmittance of NIR and PAR. Therefore, there is no need to install the sensor outside the canopy. The device only needs to be installed inside the canopy to obtain continuous data. When the data recorder is installed on the machine, the annual variation of LAI can be measured in an unmanned and stationary manner. main features actual LAIMeasurement, only responds to parts containing chlorophyll ignorePAI（PAIMeasurement values include dead leaves, branches, trunks, etc The only adoption in the worldPARandNIRStrength ratio andLAIRelated sensors approveunmannedoperateContinuous, automaticmeasure(To be used in conjunction with a data logger) Measuring images Parameters
measuring range 0~5,000μE output Voltage (calibrated as###. ##μE/mVThe calibration coefficient System sensitivity: ・PAR/10mV at 2300uE ・NIR/5mV at 1300uE Conversion Formula LAI=2.80In(NIR/PAR)+0.69* temperature effect <±0.1％/DEG oneposition PAR & NIR(μmol・S-1・m-2) response speed 0.2u/Sec incident anglelinear measurecharacteristic less than±1.5% Rotation angle characteristics less than±0.5% materialnature Shell:A5052 Coating: Anodized Aluminum Oxide Diffuser:PTFE temperature range -40~80℃ shape 126mm(W)、60mm(D)×49mm(H) weight 500g portallocation white+, Black- Origin and Manufacturer: EMJ Japan
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