Shanghai Yucheng Optoelectronics Technology Co., Ltd
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M2 measurement system
M2 measurement system
Product details

MSquare measurement system

M² Beam

Multi axis slit scanning laser analyzer, extended measurement M ² device

·The M ² system provides the ability to analyze and visualize light beams, measuring the position and size of the waist spot on the two coordinate axes M ² of continuous wave lasers. The M ² factor is measured according to ISO/CD 11 146. In addition, the instrument can measure the width, position, and energy of the profile.
·The M ² measurement system uses a Super Beam Alyzer ™ Head and an independent measuring device.

Applied to measurement:

·Beam transmission (M ²)
·Waist position
·Waist diameter
·Divergence
·Raleigh range
·Asymmetric waistband

·Astigmatism

FocusGage

Independent tomographic beam analysis, multi axis slit scanning laser analyzer, device for extended measurement of divergence and depth of field

·FocusGage ™ It is a multi-purpose, multifunctional, computer-based measurement system that providesIntensity distribution of multi blade beamThe ability to analyze and illustrate, measure the depth of field, waist size, waist position, and divergence (NA) of continuous laser and laser diode on two coordinate axes. The measurement of depth of field is achieved by scanning a laser beam along the propagation axis and measuring the beam size at different positions.

·FocusGage ™ Applied in laser printers, building laser systems, far-field laser calibration, particle measurement, fiber optic measurement, and beam affecting system performance quality and shape.

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