Product FeaturesPRODUCT FEATURE
Adopting globally leading technology and multiple domestically unique independent patents
Can be used for single-sided, standard, multi segment, and point testing of wires
The on resistance can be individually grouped and set, and on one side, the on resistance can be measured at a point
Point measurement can set the sensitivity value and color of a single line separately
Maximum measurable capacitance500μF, can measure capacitance and positive and negative poles of capacitance
Short circuit and open circuit defects with precise and error free edge separation
Can be used for fast impedance testing of headphone cables
Can distinguish and test the impedance of different ground wires for headphone cables
The overall testing speed of the system has doubled compared to traditional similar products
Provide advancedUSBAndRS232Interface,And can be combined withPCOnline operation(customized)
Special materials and manufacturing processes, insulation affected by humid airless
The system provides statistical reports and printing functions
Independently designed software and hardware, customizable with other features according to customer requirements
technical specifications SPECIFICATION
measure amount When between Test time |
|
break/short circuitOpen/short |
fast(4ms/second/64spot),Slow speed(8ms/second/64spot) |
On resistanceCond |
fast55second/second,Medium speed45second/second,Slow speed30second/second0.2s/32net(standard)reference resources |
insulation resistanceInsulation resistance |
A pair of others3.6s/64net(0.01s)Two point fast0.4s/64net(0.01s) 0.01Seconds~60Second selectable settings |
High voltage communicationAC High Voltage |
A pair of others9.5s/64net(0.01s)Two point fast0.9s/64net(0.01s) 0.01Seconds~60Second selectable settings |
moment/High speed short circuit breaker INT Time |
0Seconds~99second set up0Seconds represent infinite time |
measure try ginseng numberTest parameters |
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term orderProject |
SymbolSymbol |
Scope of testingTest range |
break/short circuit |
O/S |
1KΩ~100KΩ |
Conducting resistance test |
COND |
1mΩ~50Ω |
Resistance measurement |
R |
0.1Ω~10MΩ |
Capacitance measurement |
C |
10pF~1000μF |
Diode measurement |
D |
0.0V~7.0V |
Insulation impedance |
I.S |
0.1MΩ~1000MΩ |
DC leakage current |
IL |
1μA~1000μA |
High voltage leakage current |
IL |
0.01mA~5mA |
Instantaneous conduction impedance |
INT.COND |
1mΩ~50Ω |
Quick instantaneous interruption |
INT.OPEN |
0.4ms |
Instantly short circuit breaker |
INT.O/S |
2ms/64pinsensitivity
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gauge grid say bright Specifications |
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Test scanning mode Scan Mode |
automatic/Manual/continuity/External scanning switchable |
display/Sound alarm deviceWaming device |
Pass/Fail LEDRed and green indicator lights/Screen display/Voice alarm320*240LCDLCD display, blue/White background switchable |
Storage device |
Built in512KB SRAM,Scalable1024KB |
sizeSize |
(W×D×H)425×190×350mm |
weightWeight |
about14kg(Excluding accessories) |
choose purchase finger southSelection Guide |
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Product model
Product Type |
Number of measurement points
Test Points |
Measure voltage
Test Voltage |
LK-5810N |
64pin |
DC:5~1000V |
LK-5810N2 |
128pin |
DC:5~1000V |
LK-5810NA |
64 pin |
DC:5~1000V,AC:100~800V |
LK-5810NA2 |
128pin |
DC:5~1000V,AC:100~800V |
LK-5810FA |
64 pin |
DC:5~1500V,AC:100~1000V |
LK-5810FA2 |
128pin |
DC:5~1500V,AC:100~1000V |