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LCD Conductive Particle Inspection Microscope MX12RT
The MX12RT LCD Conductive Particle Inspection Microscope is a brand new MX12RT semiconductor/FPD inspection microscope that supports inspection of 300
Product details
The LCD conductive particle inspection microscope adopts ergonomic design to comprehensively improve, providing users with a more comfortable, flexible, and fast operating experience.
Adjustable elevation angle observation tube
The observation angle can be adjusted from 0 to 35 degrees, suitable for users of different heights, reducing the requirements for the working environment, allowing different users to find high-quality observation angles, reducing discomfort and fatigue caused by long-term work, and greatly improving work efficiency.
New clutch driven loading platform
MX12R adopts a clutch handle, and users can flexibly move the platform by pressing the clutch wrench, without the need to pinch the handle for a long time; Press the clutch button to cancel the fast movement. Avoid numbness during prolonged operation and increase observation speed. MX12R introduces a precision guide rail transmission mechanism, which makes the movement lighter and smoother, and the product more stable and reliable.
Safe and high-speed electric objective lens converter
Equipped with forward and backward switching modes, it can quickly and accurately locate the desired observation magnification, with high repeatability accuracy. The mechanical switching mode effectively improves the service life of the converter.
The buttons are within reach, helping you improve work efficiency
The MX12R objective lens and aperture stop adopt a brand new electric control system, with operation buttons located directly in front of the instrument, making it within your reach. The humanized electric design not only avoids frequent manual operation steps, but also makes your inspection work more accurate and flexible.
Seismic bracket design
The body is supported by a six terminal bracket, with a low center of gravity and high stability all metal frame, which has strong seismic resistance and ensures stable image quality.
Rich application areas
MX12R integrates multiple observation functions such as bright field, dark field, polarization, DIC, etc. Widely used in semiconductors FPD、 Testing of circuit packaging, circuit substrates, materials, cast metal ceramic components, precision grinding tools, etc.
LCD Conductive Particle Inspection Microscope MX12RT Configuration Parameters
Optical system |
Infinite chromatic aberration correction optical system |
Observation method |
Bright field/Dark field/Polarization/DIC |
Observation tube |
Infinite hinge three-way observation tube, adjustable tilt angle from 0-35 °, positive image, pupil distance adjustment: 50-76mm, spectral ratio 100:0 or 0:100 |
Eyepiece |
High eye point, large field of view, flat field eyepiece PL10X/25mm, adjustable visual acuity, with a single scale cross reticle |
Objective lens |
Infinite bright dark field semi complex elimination metallographic DIC objective 5X 10X 20X 50X 100X |
Infinite long working distance bright dark field semi complex elimination metallographic DIC objective 20X | |
Infinite long working distance bright dark field semi complex elimination metallographic objective 50X 100X | |
Converter |
Light dark field six hole electric converter with DIC slot |
Rack group |
Reflective rack, front low hand position coarse and micro coaxial focusing mechanism. Coarse adjustment stroke of 35mm, fine adjustment accuracy of 0.001mm. Equipped with anti slip adjustment elastic device and random upper limit device. Built in 100-240V wide voltage system |
Transparent and reflective frame, front low position coarse and micro coaxial focusing mechanism. Coarse adjustment stroke of 35mm, fine adjustment accuracy of 0.001mm. Equipped with anti slip adjustment elastic device and random upper limit device. Built in 100-240V wide voltage system | |
Carrier platform |
Right hand position 14 × 12 inch three-layer mechanical mobile platform, low hand position X and Y direction coaxial adjustment; Platform area 718mmX420mm, movement range: 356mmX305mm |
Equipped with a clutch handle, it can be used for rapid movement within the full range of travel; Glass loading platform (for reflection) | |
Electric platform |
Area 495mmX641mm, movement range: 306mmX306mm; software controls X and Y movement, repeat positioning accuracy, (3+L/50) μ m with tablet platform |
Lighting system |
Bright and dark field reflector with variable electric aperture stop, field stop, adjustable center; Equipped with a light dark field lighting switching device; Slot with color filter and polarizing device |
Photography and videography accessories |
0.5X/0.65X/1X camera adapter, C-type interface, adjustable focus |
Other |
Polarizing mirror insert board, fixed analyzer insert board, reflective interference filter group; High precision micrometer; DIC component |
Photo effect of LCD conductive particle inspection microscope:
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