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Krypton analysis using helium ion chromatography
The instrument is equipped with a highly sensitive helium ionization detector and adopts the central cutting technology of Huaai Company. The injectio
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The helium ion chromatograph is suitable for detecting trace impurities in gases used in the electronic industry, with a small detection concentration of up to 5ppb. The instrument is equipped with a highly sensitive helium ionization detector and adopts the central cutting technology of Huaai Company. The injection valves are all equipped with blow off protection gas paths; The whole machine adopts a multi column box design and is equipped with an automatic calibration system for injection pressure to ensure the injection volume of samples with different bottom gases. The product has successively won the A-level project for the transformation of high-tech achievements in Shanghai.
Krypton analysis using helium ion chromatographyReference: GB/T 5829-2006 Krypton Gas
| project | index | |||
| High-purity krypton | Pure Krypton | |||
| First Grade | Qualified products | |||
| Krypton gas (Kr) (volume fraction)/10-2 | ≥ | 99.999 | 99.995 | 99.99 |
| Nitrogen (N2) (volume fraction) (N2)/10-6 | ≤ | 2 | 8 | 20 |
| Oxygen (O2)+argon (Ar) (volume fraction)/10-6 | ≤ | 1.5 | 5 | 5 |
| Hydrogen (H2) (volume fraction)/10-6 | ≤ | 0.5 | 1 | 2 |
| Carbon monoxide (CO) (volume fraction)/10-6 | ≤ | 0.3 | 0.4 | 1 |
| Carbon dioxide (CO2) (volume fraction)/10-6 | ≤ | 0.4 | 0.8 | 1 |
| Methane (CH4) (volume fraction)/10-6 | ≤ | 0.3 | 0.8 | 1 |
| Moisture (H2O) (volume fraction)/10-6 | ≤ | 2 | 3 | 5 |
| Xenon gas (Xe) (volume fraction)/10-6 | ≤ | 2 | 20 | 50 |
| Fluoride (CF4) (volume fraction)/10-6 | ≤ | 1 | 10 | 15 |
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