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Ion Beam Profiler
The new Photonis ion beam analyzer enables visualization of any charged particles (ions, electrons, UV photons, or soft X-rays, etc.), capturing image
Product details
New typePhotonis ion beam analyzerachieveAny charged particle (ion, electron,UV photons or soft X-rays, etcVisualization,use100 frames per secondCapture images at high speed and store them inOn PC，Can be done through system integrationIon beam profile analysis,supportSelect the shutter speed.
Depending on the application，Choose different types of microchannel boards when placing an order, including the backendNocturn CMOSeach otherThe machine can outputSXGA (1280x1024) images in NTSC, PAL, or CameraLink compatible formats, with a computer interface of Gigabit Ethernet or USB3, used for static capture of real-time video or ion beam feature images.
Product Features
High sensitivity CMOS camera
Custom microchannel board
Analog or digital images
Real time feedback on ion loss and optimization
Technical parameters
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Physical properties of MCPs |
Electrical characteristics of detectors |
CMOS camera |
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Use diameter25, 40, 75, 100 mm
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Electronic gain @ 2400V 1 x 107Minimum |
Nocturn XL Monochrome |
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MCP hole spacing6, 12, 32 µm
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Bias current range 20-199 mA @ 2400V |
Pixel size 9.7 x 9.7 µ m |
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Resistance 12-120 Megohms |
Pixel count 1280 x 1024 |
Related applications
Single photon measurement; Mass spectrometer; Ion beam analysis; WMI; Spectroscopy;
Product Information
Ion-Beam-Profiler-Datasheet
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