Ningbo Ruike Weiye Instrument Co., Ltd
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    18157427375,13806673976,18157427371
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    No. 58, Lane 225, Kaiyuan Road, Hongtang Industrial Zone C, Jiangbei, Ningbo, Zhejiang
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FT-3110 series fully automatic four probe tester
FT-3110 series fully automatic four probe tester
Product details
Detailed Introduction

Function Description

Four point probe method, fully automated operation measurement system, PC software acquisition and data processing; Refer to A S. The T.M standard method is used to test the resistivity and block resistance of semiconductor materials; Can set probe pressure values, test points, and multiple measurement mode options; Vacuum environment, can display: square resistance, resistivitydisplay2D, 3D scanning/numerical chart, temperature and humidity valuesProvide standard calibration resistorsReport outputData statistical analysis.

FT-3110 series fully automatic four probe tester


two.Scope of application

WaferAmorphous silicon/Measurement of resistivity of microcrystalline silicon and conductive film; Selective emitter diffusion sheet; Surface passivation film; Cross finger PN junction diffusion sheet* Electrode design, such as electroplating copper resistance measurement, etc;Semiconductor material analysis, ferroelectric materials, nanomaterials, solar cells,LCD,OLED, Touch screen, etc

threeTechnical parameters:

Specification and model

FT-3110A

FT-3110B

1. Resistance

10^-5~2×10^5Ω

10^-6~2×10^5Ω

2. Block resistor

10^-5~2×10^5Ω/□

10^-6~2×10^5Ω/□

3. Electrical resistivity

10^-6~2×10^6Ω-cm

10-7~2×106Ω-cm

4. Test current

0.1μA.μA.0μA,100µA,1mA,

10mA, one hundredmA

1A100mA10mA1mA100uA10uA1uA0.1uA

5. Current accuracy

±0.1%

6. Resistance accuracy

≤0.3%

7. PC software operation

PC software interface: resistance, resistivity, conductivity, square resistance, temperature, unit conversion, current, voltage, probe shape, probe spacing, thickness2D, 3DatlasPressure

Report generationetc.

8. Pressure range:

Adjustable range of probe pressure: software control,100-500gAdjustable

9. Exploreneedle

Inter needle insulation resistance: ≥ 1000MΩ; Mechanical drift rate: ≤ 0.3%

Round headcoppergold-platedtexture of material,Probe spacing1mm; 2mm; 3mm optional,Other specifications can be customized

10.Measurable chip

sizechoose

Wafer size: 2-12 inches6 inches150mm,12 inches300mm);

Square piece: up to 156mm X 156mm or 125mm X 125mm

11. Analysis mode

Automatic testing of single point, five point, nine point, multi-point, diameter scanning, surface scanning and other modes

12Pressure method

Measurement repeatability: repeatability ≤3%

13. Safety protection

Equipped with limit range and pressure protection; Misoperation and emergency stop protection; Abnormal alarm

14.testing environment

vacuum

15Power supply

Input: AC 220V±10%.50Hz power consumption:<100W

16. Purchase items

Computers and printers

FT-3110系列全自动四探针测试仪

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Successful operation!

Successful operation!

Successful operation!