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Energy dispersive X-ray fluorescence spectrometer
Energy dispersive X-ray fluorescence spectrometer
Product details
The EDX 4500H X fluorescence spectrometer utilizes the XRF detection principle to achieve rapid, accurate, and non-destructive analysis of various elemental components.
The main feature of this instrument is the use of an intelligent vacuum system, which can effectively excite light elements such as Si, P, S, Al, Mg, etc. The XRF technology can accurately analyze high content elements of interest such as Cr, Ni, Mo, etc. It plays a role in controlling the smelting process with short testing time, greatly improving detection efficiency and work efficiency.
In addition, it is also widely used in alloy analysis, total element analysis, and harmful element detection applications.
Performance characteristics
Ultra thin window X-ray tube
Digital multi-channel technology makes testing faster, with a counting rate of 100000 CPS and higher accuracy, resulting in better performance in alloy testing
FAST-SDD detector, with good energy linearity, energy resolution, and spectral characteristics, and high peak to back ratio
Low energy X-ray excitation of the element under test, with good excitation effect on light elements such as Si and P
Intelligent vacuum pumping system, shielding the influence of air, greatly expanding the scope of testing
The automatic spectrum stabilization device ensures the consistency of instrument operation
Electronic circuit units with high signal-to-noise ratio
Automatically switch collimators and filters for different samples, eliminating the tedious manual operation
Spectral decomposition technology decomposes spectral peaks, ensuring that the test results of the measured elements have equal analytical power
The multi parameter linear regression method significantly suppresses the absorption and amplification effects between elements
Built in high-definition camera
The LCD screen display makes important parameters of the instrument (tube pressure, tube flow, vacuum degree) clear at a glance
Standard configuration
Ultra thin window X-ray tube
FAST-SDD detector
Digital multi-channel technology
Optical path enhancement system
High signal-to-noise ratio electronic circuit unit
Built in high-definition camera
Automatic switching collimator and filter
Automatic spectrum stabilization device
Triple security protection mode
Reliable overall steel frame structure
90mm × 70mm status display LCD screen
vacuum pump
application area
Alloy testing, full element analysis, hazardous element testing (RoHS, halogen)
The main feature of this instrument is the use of an intelligent vacuum system, which can effectively excite light elements such as Si, P, S, Al, Mg, etc. The XRF technology can accurately analyze high content elements of interest such as Cr, Ni, Mo, etc. It plays a role in controlling the smelting process with short testing time, greatly improving detection efficiency and work efficiency.
In addition, it is also widely used in alloy analysis, total element analysis, and harmful element detection applications.
Performance characteristics
Ultra thin window X-ray tube
Digital multi-channel technology makes testing faster, with a counting rate of 100000 CPS and higher accuracy, resulting in better performance in alloy testing
FAST-SDD detector, with good energy linearity, energy resolution, and spectral characteristics, and high peak to back ratio
Low energy X-ray excitation of the element under test, with good excitation effect on light elements such as Si and P
Intelligent vacuum pumping system, shielding the influence of air, greatly expanding the scope of testing
The automatic spectrum stabilization device ensures the consistency of instrument operation
Electronic circuit units with high signal-to-noise ratio
Automatically switch collimators and filters for different samples, eliminating the tedious manual operation
Spectral decomposition technology decomposes spectral peaks, ensuring that the test results of the measured elements have equal analytical power
The multi parameter linear regression method significantly suppresses the absorption and amplification effects between elements
Built in high-definition camera
The LCD screen display makes important parameters of the instrument (tube pressure, tube flow, vacuum degree) clear at a glance
Standard configuration
Ultra thin window X-ray tube
FAST-SDD detector
Digital multi-channel technology
Optical path enhancement system
High signal-to-noise ratio electronic circuit unit
Built in high-definition camera
Automatic switching collimator and filter
Automatic spectrum stabilization device
Triple security protection mode
Reliable overall steel frame structure
90mm × 70mm status display LCD screen
vacuum pump
application area
Alloy testing, full element analysis, hazardous element testing (RoHS, halogen)
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