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Beijing Jinzhengmao High and Low Temperature Vacuum Probe Station
The high and low temperature vacuum probe station can perform high and low temperature tests (4.2K~500K) in a vacuum environment. It can upgrade the l
Product details
Low temperature vacuum probe station
Product Overview:
Capable of conducting high and low temperature tests in a vacuum environment（4.2K~500K）Upgradeable loading magnetic field, low-temperature radiation proof screen design, sample stage made of high-purity oxygen free copper for better temperature uniformity, temperature sensor with good stability and repeatabilityPT100Alternatively, calibrated silicon diodes can be used as temperature measuring devices, supporting fiber optic spectral characteristic testing, compatible with high magnification metallographic microscopes, and capable of fine tuning movement. The high-frequency characteristics of the device are also supported(Support * High67GHzfrequency)Probe heat sink design,LD/LED/PDThe intensity of light/Wavelength testing, automatic flow control, materials/The device'sIV/CVCharacteristic testing, etc.
Capable of conducting high and low temperature tests in a vacuum environment（4.2K~500K）Upgradeable loading magnetic field, low-temperature radiation proof screen design, sample stage made of high-purity oxygen free copper for better temperature uniformity, temperature sensor with good stability and repeatabilityPT100Alternatively, calibrated silicon diodes can be used as temperature measuring devices, supporting fiber optic spectral characteristic testing, compatible with high magnification metallographic microscopes, and capable of fine tuning movement. The high-frequency characteristics of the device are also supported(Support * High67GHzfrequency)Probe heat sink design,LD/LED/PDThe intensity of light/Wavelength testing, automatic flow control, materials/The device'sIV/CVCharacteristic testing, etc.
Capable of conducting high and low temperature tests in a vacuum environment（4.2K~500K）Upgradeable loading magnetic field, low-temperature radiation proof screen design, sample stage made of high-purity oxygen free copper for better temperature uniformity, temperature sensor with good stability and repeatabilityPT100Alternatively, calibrated silicon diodes can be used as temperature measuring devices, supporting fiber optic spectral characteristic testing, compatible with high magnification metallographic microscopes, and capable of fine tuning movement. The high-frequency characteristics of the device are also supported(Support * High67GHzfrequency)Probe heat sink design,LD/LED/PDThe intensity of light/Wavelength testing, automatic flow control, materials/The device'sIV/CVCharacteristic testing, etc.
Application scope:
Chip testing, material testing, Hall testing, electromagnetic transport characteristics, etc. in high and low temperature vacuum environments.
Optional Accessories：
þShockproof table
þMulti-stage compression refrigeration machine
þmechanical pump/Molecular pump group/ion pump
þRF components
þVarious types of frequency vacuum joints
þVarious typesDCProbes, high-frequency probes, active probes, cables, etc
þVarious probe fixtures
þ ChuckMotion device
þElectromagnetic system/superconducting magnet system
þ 1MpaPositive pressure system
þUltra high temperature upgrade option
þUltra high vacuum upgrade option
High and low temperature vacuum probe stationTechnical indicators:
model
T81-50probe station
T80-50probe station
Cooling method
liquid helium/Liquid nitrogen refrigeration
Closed cycle refrigeration machine
Material of the cavity
Non magnetic stainless steel or aluminum alloy
vacuum degree
Superior High Vacuum10-8Pa
Size of vacuum chamber observation window
2inch(Optional)
Temperature Control Range
4.2K-450K
5K-450K
Temperature control resolution
0.001KTemperature controller related
Temperature Stability
0.1KTemperature controller related
Cooling time
40min
150minInternally, depending on the power of the refrigeration unit
temperature sensor
Silicon diodesPT100（3One sample stage, one probe arm, and one radiation shielding screen
Heating power supply
LVDCLow voltage direct current
Sample table material
Gold plated oxygen free copper
Sample table size
diameter20-50mm, optional100mm
Flatness of sample table
≤7μm
Sample table fixing method
Fixed sample stage (upgradable and movable with displacement stage)
Sample table vibration level
≤50nanometre
≤1μm(Three level shock absorption)
Number of probe arms
2One4One6One8Optional
Probe arm mechanical accuracy
±12.5mm(Upgradeable ±25mm),accuracy1μm(Optional)
Probe type
Tungsten, beryllium copper, microwave probe (optional up to)67GHzofGSGProbe)
Probe adjustment
Vacuum bellows external adjustment, manual control
magnification
16~100X/20~4000X
Microscope travel
X、Yplane2*2inch, accuracy1μm，ZAxis travel ≥50.8mm
Power demand
220V 50-60Hz
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