Atomic force microscope confocal spectrometer NanFlex

This product is an equipment that integrates multiple advanced technologies such as atomic force microscopy, Raman spectroscopy, and scanning probe microscopy.

Purpose:
Chemistry. Combining scanning probe spectroscopy and confocal Raman spectroscopy to analyze the composition and structure of organic and inorganic compounds;
Physics. Analyze the physical properties of different substrates;
biology Study the interactions between organizations, cells, cell structures, and biomolecules;
Interdisciplinary analysis. Nanotechnology, pharmacology, materials science, mineralogy, geology, oil painting analysis, etc;

Application:
Scanning probe spectra;
Scanning confocal Raman spectroscopy;
Near field scanning spectroscopy;
Enhanced Raman Spectroscopy with Probes (TERS);
Enhanced Probe Fluorescence Spectroscopy (TEFS);

Advantages of NanoFlex:
Synchronous confocal spectroscopy, morphological information;
Obtain scanning spectra of the sample surface;
Merge operation of scanning platform and scanning head;
Horizontal placement of optical mechanisms;
Can be used in conjunction with upright and inverted microscopes to measure transparent or opaque samples;
Multi institutional linkage software;

NanoFlex integrates:
Scanning probe microscope;
Optical microscope (upright or inverted);
Confocal laser microscope;
Raman spectrometer, fluorescence spectrometer;