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Atomic Force Microscope (Teaching Type) FM Nanoview T-AFM
Atomic Force Microscope (Teaching Type) FM Nanoview T-AFM
Product details
◆Small and detachable design, very easy to carry and teach
◆The laser detection head and sample scanning table are integrated into one, with a very stable structure and strong anti-interference ability
◆Precision probe positioning device, laser spot alignment adjustment is very simple
◆Single axis drive sample automatically approaches the probe vertically, scanning the needle tip perpendicular to the sample
◆Intelligent needle insertion method for motor controlled automatic detection of piezoelectric ceramics, protecting probes and samples
◆automaticOptical positioningNo need for focusing, real-time observation and positioning of probe sample scanning area
◆Spring suspension shock-absorbing method, simple and practical, with good shock-absorbing effect
◆Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%
technical parameter
| Working mode | Tap mode, RMS-Z curve | Sample table itinerary | 15×15mm |
| Optional mode | Contact, friction/lateral force, amplitude/phase, magnetic/electrostatic force | Optical observation | 4X optical objective lens/2.5um resolution |
| Optional force curve | F-Z force curve | Scanning rate | 0.6Hz~30Hz |
| XY scanning range | 20 × 20um, optional 50 × 50um, 100 × 100um | Scanning angle | 0~360° |
| Z-scan range | 2.5um, optional 5um, 10um | Operating environment | Windows XP/7/8/10 operating system |
| Scanning resolution | Horizontal 0.2nm, vertical 0.05nm | communication interface | USB2.0/3.0 |
| Sample size | Φ≤90mm，H≤20mm | Shock absorption design | Spring suspension |
Application Cases
DNA/Scanning range2µm×2µmvirus/Scanning range5µm×5µm blood corpuscle/Scanning range80µm×80µm
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