Atomic Force Microscope Optical Integrated Machine FM Nanoview Op AFM-Global supplier

Beijing Century Kexin Scientific Instrument Co., Ltd

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Room 102, Building D, Jingmao International Apartment, Jingtong Expressway Exit, Chaoyang District, Beijing

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Atomic Force Microscope Optical Integrated Machine FM Nanoview Op AFM

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◆ Optical metallographyMicroscopeIntegrated design with atomic force microscope, powerful functionality

◆ Simultaneously equipped with optical microscope and atomic force microscope imaging functions, both can work simultaneously without affecting each other

◆ Simultaneously equipped with optical two-dimensional measurement and atomic force microscope three-dimensional measurement functions

◆ The laser detection head and sample scanning table are integrated into one, with a very stable structure and strong anti-interference ability
◆ Precision probe positioning device, laser spot alignment adjustment is very simple
◆ Single axis drive sample automatically approaches the probe vertically, scanning the needle tip perpendicular to the sample
◆ Intelligent needle insertion method for motor controlled automatic detection of piezoelectric ceramics, protecting probes and samples

◆ Ultra high magnification optical positioning system, achieving precise positioning of probe and sample scanning areas
◆ Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%

technical parameter

Working mode	Contact mode, tap mode	Optical eyepiece	10X
Optional mode	Friction/lateral force, amplitude/phase, magnetic/electrostatic force	Lighting method	LED Kohler Lighting System
Force spectrum curve	F-Z force curve, RMS-Z curve	Optical focus	Coarse and micro manual focusing
XY scanning range	50 × 50um, optional 20 × 20um, 100 × 100um	camera	5-megapixel CMOS sensor
Z-scan range	5um, optional 2.5um, 10um	display	10.1-inch flat panel display with image measurement function
Scanning resolution	Horizontal 0.2nm, vertical 0.05nm	Scanning rate	0.6Hz~30Hz
Sample size	Φ≤68mm，H≤20mm	Scanning angle	0~360°
Sample table itinerary	25×25mm	Operating environment	Windows XP/7/8/10 operating system
Optical objective lens	5X/10X/20X/50X flat field apochromatic objective lens	communication interface	USB2.0/3.0