Brand: Gatan Model: Murano 525
Manufacturer: Gatan Company, USA Distributor: Obotong Co., Ltd
Murano heating table, model 525
Many metallurgical and materials science studies can benefit from directly observing heating experiments of samples in SEM. The new Murano heating table enables us to dynamically observe the phase transition, recrystallization, grain growth, and oxidation phenomena of the sample during the heating process.
This heating stage can easily interface with most standard sample stages of scanning electron microscopes, and it includes an insulated interface suitable for secondary electron imaging, electron backscatter diffraction (EBSD), and focused ion beam (FIB) processing.
The temperature range of the sample stage covers room temperature to 950 ° C. For catalytic, reduction, or oxidation reactions, a capillary tube adjacent to the sample can be optionally equipped for gas injection. The external gas flow through the capillary tube is controlled by a needle valve on the flange.
The water-cooled base and shield are used to protect the internal compartment of SEM and the detectors around it. Each system is equipped with a low vibration heat exchanger interlocked with a safety flow switch, as well as a power supply and a PC based temperature controller.
There is an integral bias control on the interface flange, which is used to suppress the emission of hot electrons during the heating process and promote the collection of secondary electrons. Thus obtaining performance under heating conditions.
The sample heating platform is a consumable material designed to facilitate the loading of samples. The recording software allows for the recording of timestamps at each temperature.
When working with DigiScan ® When used together with digital electron beam control and image processing systems, the temperature data of Murano heating station can be "imprinted" on experimental images and videos recorded through Gatan In situ video software.
The Murano heating table has opened up a new method for in-situ experiments, allowing us to study the entire heating process of a sample in one SEM experiment. It enables us to quickly characterize samples without the need to prepare multiple samples, while ensuring the continuity of the region of interest to be studied.
