12 inch large work platform semiconductor/FPD inspection microscope provides users with efficient semiconductor/FPD optical detection solutions

Adjustable elevation angle observation tube

The observation angle can be adjusted from 0 to 35 degrees, suitable for users of different heights, reducing the requirements for the working environment, allowing different users to find the best observation angle, reducing discomfort and fatigue caused by long-term work, and greatly improving work efficiency.

New clutch driven loading platform

MX12R adopts a clutch handle, and users can flexibly move the platform by pressing the clutch wrench, without the need to pinch the handle for a long time; Press the clutch button to cancel the fast movement. Avoid numbness during prolonged operation and increase observation speed. MX12R introduces a precision guide rail transmission mechanism, which makes the movement lighter and smoother, and the product more stable and reliable.

Safe and high-speed electric objective lens converter

Equipped with forward and backward switching modes, it can quickly and accurately locate the desired observation magnification, with high repeatability accuracy. The mechanical switching mode effectively improves the service life of the converter.

The buttons are within reach, helping you improve work efficiency

The MX12R objective lens and aperture stop adopt a brand new electric control system, with operation buttons located directly in front of the instrument, making it within your reach. The humanized electric design not only avoids frequent manual operation steps, but also makes your inspection work more accurate and flexible.

Seismic bracket design

The body is supported by a six terminal bracket, with a low center of gravity and high stability all metal frame, which has excellent seismic resistance and ensures stable image quality.

Built in flexible handling device

The MX12R body is made of all metal material, which provides excellent stability. There are built-in handling devices at both ends of the bottom. When handling, users only need to rotate and twist the built-in handling handle out and back in to form a sturdy handling device. The setting of this device can evenly distribute the weight of the machine, and only two people are needed to complete the transportation, effectively avoiding many problems such as being at a loss, difficult to move, uneven weight distribution, and collisions during the transportation process. During the transportation process, in order to prevent damage caused by the movement of the instrument platform, the platform can be locked to ensure the safety and stability of the instrument.

Falling beam illumination device

The aperture stop and objective magnification are automatically matched, without the need for manual adjustment, making it faster and more efficient, allowing different users to have the same observation effect.

In dark field mode, the aperture automatically opens, reducing the user's professional technical requirements for the microscope and simplifying microscopic observation.

Meet the application requirements of automation

The newly upgraded MX12RMOT, with fully automatic operation mode, makes your inspection work more efficient.

X/Y/Z three-axis electric control, electric objective lens conversion, automatic matching of aperture stop.

The movement of the X, Y, and Z axes of the 12 inch platform can be controlled through software or a controller to complete image stitching function, allowing for perfect observation and analysis of global images.

The independent operating handle makes the platform movement simpler and more convenient, avoiding platform damage caused by improper personnel operation and other reasons.

Rich application areas

MX12R integrates multiple observation functions such as bright field, dark field, polarization, DIC, etc. Widely used in semiconductors FPD、 Testing of circuit packaging, circuit substrates, materials, cast metal ceramic components, precision grinding tools, etc.

Rich and diverse accessories can meet various work environments and observation modes, presenting you with real and clear microscopic images

International leading large field eyepiece

Equipped with a 25mm wide field of view eyepiece, compared to the conventional 22mm field of view, the field of view is flatter and wider, and the edges of the field of view can be maintained

Clear and bright evidence, providing users with a more comfortable visual experience.

Provide a flatter observation range to improve work efficiency. A larger range of refractive power adjustment can meet the needs of more users.

Long working distance objective lens

Equipped with a complete set of professional semi chromatic aberration corrected metallographic objectives, using high transmittance lenses and advanced coating technology.

Long working distance design can effectively avoid collision between the objective lens and the sample when switching. Configure a 20X long working distance objective lens to meet the needs of the industrial inspection field.

Each lens strictly selects high transmittance lenses and advanced coating technology, which can truly reproduce the natural colors of the sample.

Normansky differential interference contrast system

●By using high-performance differential interference components, subtle height differences that cannot be detected under bright field observation can be transformed into high contrast brightness differences and expressed in the form of three-dimensional relief. It is widely used in fields such as LCD conductive particles and precision disk surface scratch detection.

System configuration diagram

Outline dimension diagram

12 inch large work platform semiconductor/FPD inspection microscope technical specifications